Invention Grant
- Patent Title: Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
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Application No.: US14950138Application Date: 2015-11-24
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Publication No.: US10254331B2Publication Date: 2019-04-09
- Inventor: Frederick A. Ware
- Applicant: Rambus Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Rambus Inc.
- Current Assignee: Rambus Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Silicon Edge Law Group LLP
- Agent Arthur J. Behiel
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/28 ; G11C29/02 ; G11C29/12 ; G11C29/16 ; G11C29/50 ; G01R31/26 ; H03L7/00 ; G11C29/04

Abstract:
A semiconductor IC device comprises a timing circuit to transfer a timing signal, the timing circuit being configured to receive a first test signal and to effect a delay in the timing signal in response to the first test signal, the first test signal including a first timing event. The semiconductor IC device further comprises an interface circuit configured to transfer the data signal in response to the timing signal, the interface circuit being further configured to receive a second test signal and to effect a delay in the data signal in response to the second test signal, the second test signal including a second timing event that is related to the first timing event according to a test criterion.
Public/Granted literature
- US20160161552A1 Methods and Apparatus for Testing Inaccessible Interface Circuits in a Semiconductor Device Public/Granted day:2016-06-09
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