Invention Grant
- Patent Title: Support structure and highly aligned monochromatic X-ray optics for X-ray analysis engines and analyzers
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Application No.: US15334886Application Date: 2016-10-26
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Publication No.: US10256002B2Publication Date: 2019-04-09
- Inventor: Zewu Chen , Rory D. Delaney , John H. Burdett , Kai Xin
- Applicant: X-RAY OPTICAL SYSTEMS, INC.
- Applicant Address: US NY East Greenbush
- Assignee: X-RAY OPTICAL SYSTEMS, INC.
- Current Assignee: X-RAY OPTICAL SYSTEMS, INC.
- Current Assignee Address: US NY East Greenbush
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Kevin P. Radigan, Esq.
- Main IPC: G21K1/06
- IPC: G21K1/06 ; G01N23/207 ; G01N23/223

Abstract:
A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.
Public/Granted literature
- US20170110212A1 SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATIC X-RAY OPTICS FOR X-RAY ANALYSIS ENGINES AND ANALYZERS Public/Granted day:2017-04-20
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