Invention Grant
- Patent Title: Fabrication of semiconductor structures
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Application No.: US15627965Application Date: 2017-06-20
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Publication No.: US10256092B2Publication Date: 2019-04-09
- Inventor: Daniele Caimi , Lukas Czornomaz , Veeresh Deshpande , Vladimir Djara , Jean Fompeyrine
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Daniel P. Morris, Esq.
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/8238 ; H01L29/06 ; H01L29/786 ; H01L29/66 ; H01L21/84 ; H01L27/12 ; H01L27/092 ; H01L21/3065 ; H01L21/311 ; H01L21/8258

Abstract:
The invention relates to a method for fabricating a semiconductor circuit comprising providing a semiconductor substrate; fabricating a first semiconductor device comprising a first semiconductor material on the substrate and forming an insulating layer comprising a cavity structure on the first semiconductor device. The cavity structure comprises at least one growth channel and the growth channel connects a crystalline seed surface of the first semiconductor device with an opening. Further steps include growing via the opening from the seed surface a semiconductor filling structure comprising a second semiconductor material different from the first semiconductor material in the growth channel; forming a semiconductor starting structure for a second semiconductor device from the filling structure; and fabricating a second semiconductor device comprising the starting structure. The invention is notably also directed to corresponding semiconductor circuits.
Public/Granted literature
- US20170294307A1 FABRICATION OF SEMICONDUCTOR STRUCTURES Public/Granted day:2017-10-12
Information query
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