Invention Grant
- Patent Title: Preemptive idle time read scans
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Application No.: US15571232Application Date: 2017-09-30
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Publication No.: US10283205B2Publication Date: 2019-05-07
- Inventor: Ashutosh Malshe , Harish Singidi , Kishore Kumar Muchherla , Michael G. Miller , Sampath Ratnam , John Zhang , Jie Zhou
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- International Application: PCT/CN2017/104945 WO 20170930
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G11C16/26 ; G06F12/02 ; G06F11/07 ; G11C7/06 ; G11C16/34 ; G06F11/22

Abstract:
Devices and techniques for initiating and controlling preemptive idle time read scans in a flash based storage system are disclosed. In an example, a memory device includes a NAND memory array and a memory controller to schedule and initiate read scans among multiple locations of the memory array, with such read scans being preemptively triggered during an idle (background) state of the memory device, thus reducing host latency during read and write operations in an active (foreground) state of the memory device. In an example, the optimization technique includes scheduling a read scan operation, monitoring an active or idle state of host IO operations, and preemptively initiating the read scan operation when entering an idle state, before the read scan operation is scheduled to occur. In further examples, the read scan may preemptively occur based on time-based scheduling, frequency-based conditions, or event-driven conditions triggering the read scan.
Public/Granted literature
- US20190103164A1 PREEMPTIVE IDLE TIME READ SCANS Public/Granted day:2019-04-04
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