Invention Grant
- Patent Title: Three-dimensional memory device with through-stack contact via structures and method of making thereof
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Application No.: US15610918Application Date: 2017-06-01
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Publication No.: US10283566B2Publication Date: 2019-05-07
- Inventor: Jongsun Sel , Tuan Pham , Mitsuteru Mushiga , Yoshihiro Ikeda , Daewung Kang , Akio Nishida
- Applicant: SANDISK TECHNOLOGIES LLC
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Agency: The Marbury Law Group, PLLC
- Main IPC: H01L27/1157
- IPC: H01L27/1157 ; H01L27/11582 ; H01L27/24 ; H01L23/522 ; H01L21/768 ; H01L45/00

Abstract:
A three-dimensional memory device includes an alternating stack of insulating layers and electrically conductive layers, an array of memory structures, conductive structures located between a substrate and the alternating stack, conductive via structures, including an upper portion that overlies and contacts a top surface of a respective one of the electrically conductive layers, and a lower portion that underlies and is adjoined to the upper portion, contacts a top surface of a respective one of the conductive structures, and is electrically insulated from the rest of the electrically conductive layers. Inner, outer and intermediate dielectric spacers laterally surround a respective one of the conductive via structures.
Public/Granted literature
- US20180350879A1 THREE-DIMENSIONAL MEMORY DEVICE WITH THROUGH-STACK CONTACT VIA STRUCTURES AND METHOD OF MAKING THEREOF Public/Granted day:2018-12-06
Information query
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