- 专利标题: Analyte test strip and analyte meter device
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申请号: US15477485申请日: 2017-04-03
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公开(公告)号: US10288577B2公开(公告)日: 2019-05-14
- 发明人: Sridhar Iyengar , Ian Harding , Charles Boiteau , Colin Butters
- 申请人: AgaMatrix, Inc.
- 申请人地址: US NH Salem
- 专利权人: AgaMatrix, Inc.
- 当前专利权人: AgaMatrix, Inc.
- 当前专利权人地址: US NH Salem
- 代理机构: Larson & Anderson, LLC
- 主分类号: G01N27/327
- IPC分类号: G01N27/327 ; G01N21/77 ; G01N21/84 ; G01N33/487 ; G01N21/25 ; G01J1/42
摘要:
A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.
公开/授权文献
- US20170205370A1 Analyte Test Strip and Analyte Meter Device 公开/授权日:2017-07-20
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