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    METHOD AND APPARATUS FOR ENCODING TEST STRIPS
    3.
    发明申请
    METHOD AND APPARATUS FOR ENCODING TEST STRIPS 审中-公开
    用于编码测试条的方法和装置

    公开(公告)号：US20160061763A1

    公开(公告)日：2016-03-03

    申请号：US14871650

    申请日：2015-09-30

    申请人： AGAMATRIX, INC.

    发明人： Sridhar Iyengar ,  Charles Boiteau ,  Martin Forest ,  Colin Butters

    IPC分类号： G01N27/327

    CPC分类号： G01N27/3272 ,  A61B5/05 ,  A61B5/14 ,  A61B5/150022 ,  C12Q1/00 ,  G01N27/327 ,  G01N27/3273 ,  G01N33/48771

    摘要： A test meter for receiving a test strip comprises: (a) a housing; (b) electronic circuitry disposed within the housing and (c) a strip port connector connected to the electronic circuitry and extending to an opening in the housing, said strip port connector connecting the electronic circuitry with a received test strip. The strip port connector contains a pair of top and bottom contacts, said top and bottom contacts having a proximal end and a distal end and a central contact portion, the top and bottom contacts of the pair are transversely aligned with one another; and the distal ends of the top and bottom contacts are separated or separable from one another by insertion of a test strip between the opposed contacts. The contacts and the meter are adapted to permit detection of faulty contacts and/or coding associated with an inserted test strip.

    摘要翻译： 用于接收测试条的测试仪包括：（a）壳体; （b）设置在壳体内的电子电路和（c）连接到电子电路并延伸到壳体中的开口的条形端口连接器，所述条形端口连接器将电子电路与接收的测试条连接。 带状端口连接器包括一对顶部和底部触点，所述顶部和底部触点具有近端和远端以及中心接触部分，该对的顶部和底部触点彼此横向对准; 并且通过在相对的触点之间插入测试条，顶部和底部触点的远端彼此分离或分离。 触点和仪表适于允许检测与插入的测试条相关联的故障触点和/或编码。

    Analyte test strip and analyte meter device
    4.
    发明授权
    Analyte test strip and analyte meter device 有权

    公开(公告)号：US10288577B2

    公开(公告)日：2019-05-14

    申请号：US15477485

    申请日：2017-04-03

    申请人： AgaMatrix, Inc.

    发明人： Sridhar Iyengar ,  Ian Harding ,  Charles Boiteau ,  Colin Butters

    IPC分类号： G01N27/327 ,  G01N21/77 ,  G01N21/84 ,  G01N33/487 ,  G01N21/25 ,  G01J1/42

    摘要： A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.