Invention Grant
- Patent Title: System and method for testing an integrated circuit
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Application No.: US15427939Application Date: 2017-02-08
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Publication No.: US10288669B2Publication Date: 2019-05-14
- Inventor: Nikolay Ilkov , Winfried Bakalski
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/28

Abstract:
In accordance with an embodiment, a method of testing an integrated circuit, includes receiving a supply voltage on the integrated circuit via a first input pin, providing power to circuits disposed on the integrated circuit via the first input pin, comparing the supply voltage to an internally generated voltage, generating a digital output value based on the comparing, and applying the digital output value to a pin of the integrated circuit.
Public/Granted literature
- US20170146590A1 System and Method for Testing an Integrated Circuit Public/Granted day:2017-05-25
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