- Patent Title: Detector for X-rays with high spatial and high spectral resolution
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Application No.: US15240972Application Date: 2016-08-18
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Publication No.: US10295486B2Publication Date: 2019-05-21
- Inventor: Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz , Benjamin Donald Stripe
- Applicant: SIGRAY, INC.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N23/20058 ; G01N23/04

Abstract:
An x-ray spectrometer system comprising an x-ray imaging system with at least one achromatic imaging x-ray optic and an x-ray detection system. The optical train of the imaging system is arranged so that its object focal plane partially overlaps an x-ray emitting volume of an object. An image of a portion of the object is formed with a predetermined image magnification at the x-ray detection system. The x-ray detection system has both high spatial and spectral resolution, and converts the detected x-rays to electronic signals. In some embodiments, the detector system may have a small aperture placed in the image plane, and use a silicon drift detector to collect x-rays passing through the aperture. In other embodiments, the detector system has an energy resolving pixel array x-ray detector. In other embodiments, wavelength dispersive elements may be used in either the optical train or the detector system.
Public/Granted literature
- US20170052128A1 DETECTOR FOR X-RAYS WITH HIGH SPATIAL AND HIGH SPECTRAL RESOLUTION Public/Granted day:2017-02-23
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