- Patent Title: Process window widening using coated parts in plasma etch processes
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Application No.: US15670919Application Date: 2017-08-07
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Publication No.: US10297458B2Publication Date: 2019-05-21
- Inventor: Dongqing Yang , Tien Fak Tan , Peter Hillman , Lala Zhu , Nitin K. Ingle , Dmitry Lubomirsky , Christopher Snedigar , Ming Xia
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/3065 ; H01J37/32 ; H01L21/02 ; H01L21/3105

Abstract:
Embodiments of the present technology may include a method of etching. The method may include mixing plasma effluents with a gas in a first section of a chamber to form a first mixture. The method may also include flowing the first mixture to a substrate in a second section of the chamber. The first section and the second section may include nickel plated material. The method may further include reacting the first mixture with the substrate to etch a first layer selectively over a second layer. In addition, the method may include forming a second mixture including products from reacting the first mixture with the substrate.
Public/Granted literature
- US20190043726A1 PROCESS WINDOW WIDENING USING COATED PARTS IN PLASMA ETCH PROCESSES Public/Granted day:2019-02-07
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