Invention Grant
- Patent Title: LDMOS transistor structure and method of manufacture
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Application No.: US15986433Application Date: 2018-05-22
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Publication No.: US10304789B2Publication Date: 2019-05-28
- Inventor: Helmut Brech , Albert Birner , Matthias Zigldrum , Michaela Braun , Jan Ropohl
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/768 ; H01L23/66 ; H01L49/02 ; H01L29/78 ; H03F3/193 ; H03F3/21 ; H01L23/522

Abstract:
In an embodiment, a method includes forming a first opening in a front surface of a semiconductor substrate including a LDMOS transistor structure, and covering the first opening with a first layer to form an enclosed cavity defined by material of the semiconductor substrate and the first layer. The material of the first layer lines sidewalls of the enclosed cavity.
Public/Granted literature
- US20180277501A1 LDMOS Transistor Structure and Method of Manufacture Public/Granted day:2018-09-27
Information query
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