Invention Grant
- Patent Title: Resistive memory transition monitoring
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Application No.: US16058552Application Date: 2018-08-08
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Publication No.: US10311955B2Publication Date: 2019-06-04
- Inventor: Ulrich Backhausen , Giacomo Curatolo , Jens Rosenbusch
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Schiff Hardin LLP
- Priority: DE102016203446 20160302
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G01R31/12 ; G01R31/14 ; G11C29/02 ; G11C29/50

Abstract:
A method for monitoring a resistive memory having an array of cells coupled between respective bitlines and respective wordlines. The method includes determining, by a current determining circuit, a cell current and a cell current change rate of at least one of the cells; determining, by a control circuit, whether the cell current change rate is outside of a cell current change rate predefined range; performing, by the control circuit, a predetermined action if the control circuit determination is positive; and storing, in a memory, the determined cell current at predetermined times, and to store the determined cell current change rate.
Public/Granted literature
- US20180350434A1 RESISTIVE MEMORY TRANSITION MONITORING Public/Granted day:2018-12-06
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