- Patent Title: Method and assembly for determining the carbon content in silicon
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Application No.: US15716598Application Date: 2017-09-27
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Publication No.: US10317338B2Publication Date: 2019-06-11
- Inventor: Naveen Goud Ganagona , Moriz Jelinek , Helmut Oefner , Hans-Joachim Schulze , Werner Schustereder
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Agency: Viering, Jentschura & Partner mbB
- Priority: DE102016118204 20160927
- Main IPC: G01N21/3563
- IPC: G01N21/3563 ; G01N21/35

Abstract:
A method of determining the carbon content in a silicon sample may include: generating electrically active polyatomic complexes within the silicon sample. Each polyatomic complex may include at least one carbon atom. The method may further include: determining a quantity indicative of the content of the generated polyatomic complexes in the silicon sample, and determining the carbon content in the silicon sample from the determined quantity.
Public/Granted literature
- US20180088042A1 METHOD AND ASSEMBLY FOR DETERMINING THE CARBON CONTENT IN SILICON Public/Granted day:2018-03-29
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