A module for measuring an object located in a position finding zone; the module being configured for generating a primary beam; the module having a scanning mirror structure; the scanning mirror structure being controllable to allow the primary beam to execute a scanning movement within the position finding zone; the module being configured to allow a secondary signal to be detected when the secondary signal is produced in response to the interaction of the primary beam with the object in a deflection position of the scanning mirror structure; the module being configured to generate position finding information as a function of the deflection position of the scanning mirror structure; the module featuring a semiconductor laser component; the semiconductor laser component being configured for producing the primary beam and for detecting the secondary signal.