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公开(公告)号:US20170272713A1
公开(公告)日:2017-09-21
申请号:US15531480
申请日:2015-11-23
Applicant: Robert Bosch GmbH
Inventor: Alexander Ehlert , Felix Schmidt , Gael Pilard , Niklas Dittrich
CPC classification number: H04N9/3155 , G06F3/017 , G06F3/0418 , G06F3/0425 , H04N5/332 , H04N9/3129 , H04N9/3135 , H04N9/3173 , H04N9/3194
Abstract: A method and a projector for projecting an image pixel by pixel includes a control unit controlling a light diode device for emitting visible light, pixel by pixel, in accordance with the image to be projected and controlling an infrared diode device for emitting infrared radiation pixel by pixel based on the image to be projected and on a back radiation model, in such a way that a setpoint back radiation intensity measuring signal to be expected pixel by pixel for the actual back radiation intensity measuring signal has a predetermined value for predetermined pixels; and a radiation intensity detection device detecting pixel by pixel a back radiation intensity of reflected visible light and reflected infrared radiation and generating pixel by pixel an actual back radiation intensity measuring signal based on the detected back radiation intensities.
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公开(公告)号:US09857287B2
公开(公告)日:2018-01-02
申请号:US15130517
申请日:2016-04-15
Applicant: Robert Bosch GmbH , Koninklijke Philips N.V.
Inventor: Niklas Dittrich , Frank Fischer , Reiner Schnitzer , Jochen Hellmig , Gael Pilard , Alexander Van der Lee
CPC classification number: G01N15/1431 , G01N15/0205 , G01N15/06 , G01N15/1434 , G01N2015/0046 , G01N2015/0294 , G01N2015/0693 , G01N2015/1075 , G01N2015/1486 , G01N2015/149 , G01N2015/1493 , G01N2015/1497
Abstract: A particle sensor apparatus having an optical emitter device that is configured to emit an optical radiation so that a volume having at least one particle possibly present therein is at least partly illuminatable; an optical detector device having at least one detection surface that is struck by at least a portion of the optical radiation scattered at the at least one particle, at least one information signal regarding an intensity and/or an intensity distribution of the optical radiation striking the at least one detection surface being outputtable; and an evaluation device with which an information item regarding a presence of particles, a number of particles, a particle density, and/or at least one property of particles is identifiable and outputtable, the particle sensor apparatus also encompassing at least one lens element that is disposed so that the emitted optical radiation is focusable onto a focus region inside the volume.
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公开(公告)号:US20170052256A1
公开(公告)日:2017-02-23
申请号:US15305737
申请日:2015-03-26
Applicant: Robert Bosch GmbH
Inventor: Christoph Delfs , Frank Fischer , Reiner Schnitzer , Niklas Dittrich , Heiko Ridderbusch , Gael Pilard
CPC classification number: G01S17/42 , G01S7/4814 , G01S7/4817 , G01S17/58 , G01S17/89 , G02B26/0833 , H01S5/0261 , H01S5/0264 , H01S5/14 , H01S5/183 , H01S5/18341
Abstract: A module for measuring an object located in a position finding zone; the module being configured for generating a primary beam; the module having a scanning mirror structure; the scanning mirror structure being controllable to allow the primary beam to execute a scanning movement within the position finding zone; the module being configured to allow a secondary signal to be detected when the secondary signal is produced in response to the interaction of the primary beam with the object in a deflection position of the scanning mirror structure; the module being configured to generate position finding information as a function of the deflection position of the scanning mirror structure; the module featuring a semiconductor laser component; the semiconductor laser component being configured for producing the primary beam and for detecting the secondary signal.
Abstract translation: 一种用于测量位于位置查找区中的物体的模块; 所述模块被配置用于产生主波束; 所述模块具有扫描镜结构; 扫描镜结构是可控制的,以允许主光束在位置查找区域内执行扫描运动; 所述模块被配置为当响应于所述主光束与所述物体在所述扫描镜结构的偏转位置的相互作用而产生所述次级信号时,允许检测到次级信号; 所述模块被配置为产生作为所述扫描镜结构的偏转位置的函数的位置查找信息; 该模块具有半导体激光器部件; 所述半导体激光器部件被配置为用于产生所述主光束并用于检测所述次级信号。
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公开(公告)号:US20170185157A1
公开(公告)日:2017-06-29
申请号:US15304967
申请日:2015-03-03
Applicant: Robert Bosch GmbH
Inventor: Christoph Delfs , Niklas Dittrich , Felix Schmidt , Frank Fischer
CPC classification number: G06F3/017 , G01B11/002 , G01B11/14 , G01S3/786 , G01S17/02 , G06F3/011 , G06F3/04883 , G06K9/00335 , G06K9/00355 , G06K9/22 , G06T2207/30196
Abstract: A method for contactlessly interacting with a module, the module having a first submodule and a second submodule; in a first method step, the first submodule producing a primary beam; in a second method step, the second submodule inducing a scanning movement of the primary beam to allow image information to be projected into a projection area; in a third method step, a control command executed by an object being recognized by the module; the control command relating to contactlessly interacting with the module; in the third method step, the module detecting a geometric shape of the object.
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公开(公告)号:US20170045951A1
公开(公告)日:2017-02-16
申请号:US15305951
申请日:2015-03-02
Applicant: Robert Bosch GmbH
Inventor: Christoph Delfs , Niklas Dittrich , Lutz Rauscher , Frank Fischer
CPC classification number: G06F3/017 , G06F3/011 , G06F3/0423 , G06F3/0426 , G06F2203/04108
Abstract: A method is provided for non-contact interaction with a module, the module including a first submodule and a second submodule, a primary beam being generated by the first submodule in a first method step, the primary beam being deflected by the second submodule in a second method step in such a way that a piece of image information is projected onto a projection area, the primary beam being deflected by the second submodule in a third method step in such a way that a piece of operating information is projected onto an operating area, a control signal being generated by the module in a fourth method step if a control command is detected in a locating zone associated with the primary beam, the operating area being projected onto an operating object in the third method step if the operating object is positioned in the locating zone.
Abstract translation: 提供了一种用于与模块的非接触相互作用的方法,所述模块包括第一子模块和第二子模块,所述主梁在第一方法步骤中由所述第一子模块生成,所述主梁由所述第二子模块偏转为 第二方法步骤,使得一条图像信息被投影到投影区域上,所述主光束在第三方法步骤中被第二子模块偏转,使得一条操作信息被投影到操作区域 如果在与所述主光束相关联的定位区域中检测到控制命令,则在第四方法步骤中由所述模块生成控制信号,如果所述操作对象被定位,则在所述第三方法步骤中将所述操作区域投影到操作对象上 在定位区。
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公开(公告)号:US10652508B2
公开(公告)日:2020-05-12
申请号:US15531480
申请日:2015-11-23
Applicant: Robert Bosch GmbH
Inventor: Alexander Ehlert , Felix Schmidt , Gael Pilard , Niklas Dittrich
Abstract: A method and a projector for projecting an image pixel by pixel includes a control unit controlling a light diode device for emitting visible light, pixel by pixel, in accordance with the image to be projected and controlling an infrared diode device for emitting infrared radiation pixel by pixel based on the image to be projected and on a back radiation model, in such a way that a setpoint back radiation intensity measuring signal to be expected pixel by pixel for the actual back radiation intensity measuring signal has a predetermined value for predetermined pixels; and a radiation intensity detection device detecting pixel by pixel a back radiation intensity of reflected visible light and reflected infrared radiation and generating pixel by pixel an actual back radiation intensity measuring signal based on the detected back radiation intensities.
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公开(公告)号:US10317531B2
公开(公告)日:2019-06-11
申请号:US15305737
申请日:2015-03-26
Applicant: Robert Bosch GmbH
Inventor: Christoph Delfs , Frank Fischer , Reiner Schnitzer , Niklas Dittrich , Heiko Ridderbusch , Gael Pilard
Abstract: A module for measuring an object located in a position finding zone; the module being configured for generating a primary beam; the module having a scanning mirror structure; the scanning mirror structure being controllable to allow the primary beam to execute a scanning movement within the position finding zone; the module being configured to allow a secondary signal to be detected when the secondary signal is produced in response to the interaction of the primary beam with the object in a deflection position of the scanning mirror structure; the module being configured to generate position finding information as a function of the deflection position of the scanning mirror structure; the module featuring a semiconductor laser component; the semiconductor laser component being configured for producing the primary beam and for detecting the secondary signal.
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公开(公告)号:US20160313243A1
公开(公告)日:2016-10-27
申请号:US15130517
申请日:2016-04-15
Applicant: Robert Bosch GmbH
Inventor: Niklas Dittrich , Frank Fischer , Reiner Schnitzer , Jochen Hellmig , Gael Pilard , Alexander van der Lee
CPC classification number: G01N15/1431 , G01N15/0205 , G01N15/06 , G01N15/1434 , G01N2015/0046 , G01N2015/0294 , G01N2015/0693 , G01N2015/1075 , G01N2015/1486 , G01N2015/149 , G01N2015/1493 , G01N2015/1497
Abstract: A particle sensor apparatus having an optical emitter device that is configured to emit an optical radiation so that a volume having at least one particle possibly present therein is at least partly illuminatable; an optical detector device having at least one detection surface that is struck by at least a portion of the optical radiation scattered at the at least one particle, at least one information signal regarding an intensity and/or an intensity distribution of the optical radiation striking the at least one detection surface being outputtable; and an evaluation device with which an information item regarding a presence of particles, a number of particles, a particle density, and/or at least one property of particles is identifiable and outputtable, the particle sensor apparatus also encompassing at least one lens element that is disposed so that the emitted optical radiation is focusable onto a focus region inside the volume.
Abstract translation: 一种粒子传感器装置,其具有配置成发射光辐射的光发射器件,使得具有可能存在于其中的至少一个粒子的体积至少部分可照射; 具有至少一个检测表面的光学检测器件,所述至少一个检测表面被至少一部分在所述至少一个粒子上散射的光辐射所撞击,至少一个信息信号涉及到达所述至少一个粒子的光辐射的强度和/或强度分布 至少一个检测表面可输出; 该粒子传感器装置还包括至少一个透镜元件,所述评估装置具有关于粒子的存在,粒子的数量,粒子密度和/或粒子的至少一个性质的信息项, 被布置成使得发射的光辐射可聚焦到体积内的聚焦区域上。
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