Invention Grant
- Patent Title: Optical electrical measurement system, a measurement probe and a method therefor
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Application No.: US15314702Application Date: 2014-06-04
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Publication No.: US10330706B2Publication Date: 2019-06-25
- Inventor: Sverker Sander , Björn Olsson
- Applicant: TELEFONAKTIEBOLAGET LM ERICSSON (PUBL)
- Applicant Address: SE Stockholm
- Assignee: TELEFONAKTIEBOLAGET LM ERICSSON (PUBL)
- Current Assignee: TELEFONAKTIEBOLAGET LM ERICSSON (PUBL)
- Current Assignee Address: SE Stockholm
- Agency: Rothwell, Figg, Ernst & Manbeck, p.c.
- International Application: PCT/EP2014/061622 WO 20140604
- International Announcement: WO2015/185133 WO 20151210
- Main IPC: G01R13/04
- IPC: G01R13/04 ; G08C19/36 ; G08C23/04 ; H04Q9/00 ; G01R31/28 ; G01R31/302 ; G01R31/309
Abstract:
The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.
Public/Granted literature
- US10295569B2 Optical electrical measurement system, a measurement probe and a method therefor Public/Granted day:2019-05-21
Information query
