Invention Grant
- Patent Title: Ray tracing apparatus and method
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Application No.: US14997028Application Date: 2016-01-15
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Publication No.: US10339694B2Publication Date: 2019-07-02
- Inventor: Youngsam Shin , Wonjong Lee , Seokjoong Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2015-0041642 20150325
- Main IPC: G06T15/06
- IPC: G06T15/06 ; G06T15/00

Abstract:
A ray tracing apparatus includes a ray generator and a traversal (TRV)/intersection test (IST) integrator. The ray generator is configured to generate a ray. The TRV/IST integrator is configured to receive the ray, determine one of a ray-node intersection test, an intersection distance test, and a hit point test to be performed based on a state of the ray input thereto, and perform the determined test with respect to the ray. The ray-node intersection test, the intersection distance test, and the hit point test are performed with respect to the ray through same pipeline.
Public/Granted literature
- US20160284117A1 RAY TRACING APPARATUS AND METHOD Public/Granted day:2016-09-29
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |