中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

16 records (took 0.016 seconds)

    HYBRID RENDERING APPARATUS AND METHOD
    1.
    发明申请
    HYBRID RENDERING APPARATUS AND METHOD 审中-公开
    混合渲染装置和方法

    公开(公告)号：US20160116973A1

    公开(公告)日：2016-04-28

    申请号：US14884033

    申请日：2015-10-15

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Wonjong LEE ,  Youngsam Shin ,  Seokjoong Hwang

    IPC: G06F1/32 ,  G06T15/80 ,  G06T15/00 ,  G06T15/06 ,  G06T1/20

    CPC classification number: G06F1/3287 ,  G06F1/325 ,  G06F1/3265 ,  G06F1/3296 ,  G06T1/20 ,  G06T15/005 ,  G06T15/06 ,  Y02D10/153 ,  Y02D10/171 ,  Y02D10/172 ,  Y02D50/20

    Abstract: A hybrid rendering apparatus includes: a tile classification unit configured to classify a plurality of tiles included in a two-dimensional (2D) frame into first tiles and second tiles; a rendering unit comprising a first rendering unit configured to render the first tiles and the second tiles by using a first method and a second rendering unit configured to render the first tiles by using a second method; a tile fetcher configured to fetch one of the plurality of tiles, determine whether the fetched tile is a first tile or a second tile, and output the fetched tile to the rendering unit; and a power controller configured to control power of the second rendering unit according to a result of the determining.

    Abstract translation: 混合渲染装置包括：瓦片分类单元，被配置为将包括在二维（2D）帧中的多个瓦片分类成第一瓦片和第二瓦片; 渲染单元，包括：第一渲染单元，被配置为通过使用第一方法渲染所述第一片和所述第二片;以及第二渲染单元，被配置为通过使用第二方法渲染所述第一片; 配置为获取所述多个瓦片中的一个的瓦片取出器，确定所读取的瓦片是第一瓦片还是第二瓦片，并将所获取的瓦片输出到所述渲染单元; 以及功率控制器，被配置为根据所述确定的结果来控制所述第二渲染单元的功率。

    Ray tracing apparatus and method
    2.
    发明授权
    Ray tracing apparatus and method 有权

    公开(公告)号：US10026214B2

    公开(公告)日：2018-07-17

    申请号：US15335723

    申请日：2016-10-27

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Youngsam Shin ,  Wonjong Lee ,  Seokjoong Hwang

    IPC: G06T15/06 ,  G06T15/80 ,  G06T7/00 ,  G06T15/20 ,  G06T17/10 ,  G06T1/20 ,  G06T7/40

    Abstract: A ray tracing apparatus includes a traversal (TRV) core configured to traverse an acceleration structure (AS) to detect a first node and a second node, which intersect with a generated ray and have a determined same parent node, and to determine whether the ray intersects with an overlap region where a first bounding box corresponding to the first node overlaps a second bounding box corresponding to the second node; and, an intersection test (IST) determiner configured to calculate a first hit point where the ray intersects with a primitive belonging to the first node, which is a closer node to a view point of the ray among the first node and the second node, and to determine a final hit point of the ray based on a result of the determining of whether the ray intersects with respect to an overlap region, by the TRV core.

    Ray tracing apparatus and method
    4.
    发明授权
    Ray tracing apparatus and method 有权

    公开(公告)号：US10339694B2

    公开(公告)日：2019-07-02

    申请号：US14997028

    申请日：2016-01-15

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Youngsam Shin ,  Wonjong Lee ,  Seokjoong Hwang

    IPC: G06T15/06 ,  G06T15/00

    Abstract: A ray tracing apparatus includes a ray generator and a traversal (TRV)/intersection test (IST) integrator. The ray generator is configured to generate a ray. The TRV/IST integrator is configured to receive the ray, determine one of a ray-node intersection test, an intersection distance test, and a hit point test to be performed based on a state of the ray input thereto, and perform the determined test with respect to the ray. The ray-node intersection test, the intersection distance test, and the hit point test are performed with respect to the ray through same pipeline.

    METHOD AND APPARATUS FOR PROCESSING RAY TRACING
    6.
    发明申请
    METHOD AND APPARATUS FOR PROCESSING RAY TRACING 有权
    用于处理雷达追踪的方法和装置

    公开(公告)号：US20150379756A1

    公开(公告)日：2015-12-31

    申请号：US14591757

    申请日：2015-01-07

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Youngsam Shin ,  Wonjong Lee ,  Jaedon Lee ,  Seokjoong Hwang

    IPC: G06T15/06 ,  G06T15/50

    CPC classification number: G06T15/06 ,  G06T2210/12

    Abstract: A method of processing ray tracing comprising acquiring information about a light source and a bounding box that are located in a three-dimensional graphics (3D) graphics environment, the bounding box containing an object; testing whether a ray generated by the light source intersects the bounding box along each of first to third coordinate axes that define the 3D graphics environment based on the acquired information; and rendering the object in response to a result of the testing being that the ray intersects the bounding box along all of the first through third coordinate axes.

    Abstract translation: 一种处理光线跟踪的方法，包括获取关于位于三维图形（3D）图形环境中的光源和边界框的信息，所述边界框包含对象; 测试由所述光源产生的光线是否基于所获取的信息与所述3D图形环境中的每一个坐标轴相交; 并且响应于测试的结果渲染对象，即所述光线沿着所有第一至第三坐标轴与边界框相交。

    APPARATUS AND METHOD OF TRAVERSING ACCELERATION STRUCTURE IN RAY TRACING SYSTEM
    10.
    发明申请
    APPARATUS AND METHOD OF TRAVERSING ACCELERATION STRUCTURE IN RAY TRACING SYSTEM 审中-公开
    雷达追踪系统加速结构的装置与方法

    公开(公告)号：US20150348308A1

    公开(公告)日：2015-12-03

    申请号：US14722887

    申请日：2015-05-27

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jaedon Lee ,  Youngsam Shin ,  Wonjong Lee ,  Seokjoong Hwang

    IPC: G06T15/06

    CPC classification number: G06T15/06 ,  G06T2210/12 ,  G06T2210/52

    Abstract: A method of traversing an acceleration structure (AS) in a ray tracing system includes obtaining information about child nodes of a target node included in the AS; determining whether each of the child nodes intersects a ray based on the obtained information; determining a next target node among at least one child node that intersects the ray; and performing an operation corresponding to a type of the determined next target node.

    Abstract translation: 在光线跟踪系统中遍历加速结构（AS）的方法包括：获取关于AS中包括的目标节点的子节点的信息; 基于获得的信息确定每个子节点是否与射线相交; 确定与所述射线相交的至少一个子节点中的下一目标节点; 以及执行与所确定的下一个目标节点的类型相对应的操作。

Patent Agency Ranking