Invention Grant
- Patent Title: Skew sensor calibration
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Application No.: US15748879Application Date: 2015-10-30
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Publication No.: US10343433B2Publication Date: 2019-07-09
- Inventor: Hsue-Yang Liu , Luke P. Sosnowski , Mark H. Mackenzie
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Spring
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Spring
- Agency: HP Inc. Patent Department
- International Application: PCT/US2015/058514 WO 20151030
- International Announcement: WO2017/074470 WO 20170504
- Main IPC: B41J29/38
- IPC: B41J29/38 ; B41J2/175 ; B41J11/00 ; B41J13/00 ; B41J13/03

Abstract:
A skew sensor calibration unit including a scanner providing a scanned image of a sheet as the sheet is conveyed along a transport path, the scanned image including a leading edge of the sheet and a skew detection pattern printed thereon by a printhead. A calibration module measures a top skew of the sheet based on position signals from a plurality of skew sensors indicating a position of a leading edge of a sheet as the sheet is conveyed along the transport path, measure an image skew of the sheet relative to the printhead based on the scanned image, and generates a calibration factor that when applied to the measured top skew provides a calibrated top skew that matches the image skew.
Public/Granted literature
- US20180222231A1 SKEW SENSOR CALIBRATION Public/Granted day:2018-08-09
Information query
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