发明授权
- 专利标题: Apparatuses having memory strings compared to one another through a sense amplifier
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申请号: US15900403申请日: 2018-02-20
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公开(公告)号: US10347322B1公开(公告)日: 2019-07-09
- 发明人: Tae H. Kim , Sangmin Hwang , Si-Woo Lee
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Wells St. John P.S.
- 主分类号: G11C11/4091
- IPC分类号: G11C11/4091 ; G11C11/4097 ; G11C11/22
摘要:
Some embodiments include an apparatus having first and second comparative bitlines extending horizontally and coupled with a sense amplifier. First memory cell structures are coupled with the first comparative bitline. Each of the first memory cell structures has a first transistor associated with a first capacitor. Second memory cell structures are coupled with the second comparative bitline. Each of the second memory cell structures has a second transistor associated with a second capacitor. Each of the first capacitors has a container-shaped first node and is vertically offset from an associated first sister capacitor which is a mirror image of its associated first capacitor along a horizontal plane. Each of the second capacitors has a container-shaped first node and is vertically offset from an associated second sister capacitor which is a mirror image of its associated second capacitor along the horizontal plane.
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