Invention Grant
- Patent Title: Circular scanning technique for large area inspection
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Application No.: US15540169Application Date: 2016-01-13
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Publication No.: US10353191B2Publication Date: 2019-07-16
- Inventor: Brian W. Anthony , Xian Du
- Applicant: Massachusetts Institute of Technology
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Daly, Crowley, Mofford & Durkee LLP
- International Application: PCT/US2016/013157 WO 20160113
- International Announcement: WO2016/115203 WO 20160721
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/36 ; H04N1/00 ; G02B26/10

Abstract:
Described embodiments provide a method of generating an image of a region of interest of a target object. A plurality of concentric circular scan trajectories are determined to sample the region of interest. Each of the concentric circular scan trajectories have a radius incremented from an innermost concentric circular scan trajectory having a minimum radius to an outermost concentric circular scan trajectory having a maximum radius. A number of samples are determined for each of the concentric circular scan trajectories. A location of each sample is determined for each of the concentric circular scan trajectories. The locations of each sample are substantially uniformly distributed in a Cartesian coordinate system of the target object. The target object is iteratively rotated along each of the concentric circular scan trajectories and images are captured at the determined sample locations to generate a reconstructed image from the captured images.
Public/Granted literature
- US20170371142A1 Circular Scanning Technique For Large Area Inspection Public/Granted day:2017-12-28
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