Invention Grant
- Patent Title: One check fail byte (CFBYTE) scheme
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Application No.: US15717554Application Date: 2017-09-27
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Publication No.: US10354738B2Publication Date: 2019-07-16
- Inventor: Aliasgar S. Madraswala , Kristopher H. Gaewsky , Naveen Vittal Prabhu , Purval S. Sule , Trupti Bemalkhedkar , Nehul N. Tailor , Quan H. Ngo , Dheeraj Srinivasan
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/10 ; G11C16/04

Abstract:
Various embodiments, disclosed herein, can include apparatus and methods to perform a one check failure byte (CFBYTE) scheme in programming of a memory device. In programming memory cells in which each memory cell can store multiple bits, the multiple bits being a n-tuple of bits of a set of n-tuples of bits with each n-tuple of the set associated with a level of a set of levels of threshold voltages for the memory cells. Verification of a program algorithm can be structured based on a programming algorithm that proceeds in a progressive manner by placing a threshold voltage of one level/distribution at a time. The routine of this progression can be used to perform just one failure byte check for that specific target distribution only, thus eliminating the need to check failure byte for all subsequent target distribution during every stage of program algorithm. Additional apparatus, systems, and methods are disclosed.
Public/Granted literature
- US20190096494A1 ONE CHECK FAIL BYTE (CFBYTE) SCHEME Public/Granted day:2019-03-28
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