Invention Grant
- Patent Title: Low-density parity check decoder, a storage device including the same, and a method
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Application No.: US15652260Application Date: 2017-07-18
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Publication No.: US10374630B2Publication Date: 2019-08-06
- Inventor: Jiyoup Kim , Dong-Min Shin , Beomkyu Shin , Junjin Kong , Hong Rak Son
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2016-0091536 20160719
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C11/56 ; G11C29/52 ; H03M13/00 ; H03M13/11 ; H03M13/37
Abstract:
A low-density parity check (LDPC) decoder may include a variable node processing unit and a check node processing unit. The check node processing unit includes memory elements storing a check node value. The memory elements are interconnected through two or more paths, and each of the paths may include a total or partial cyclic permutation of the memory elements to transmit the check node value.
Public/Granted literature
- US20180026659A1 LOW-DENSITY PARITY CHECK DECODER, A STORAGE DEVICE INCLUDING THE SAME, AND A METHOD Public/Granted day:2018-01-25
Information query
