Invention Grant
- Patent Title: Low electron temperature, edge-density enhanced, surface-wave plasma (SWP) processing method and apparatus
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Application No.: US15082465Application Date: 2016-03-28
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Publication No.: US10375812B2Publication Date: 2019-08-06
- Inventor: Jianping Zhao , Lee Chen , Merritt Funk , Radha Sundararajan
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood Herron & Evans LLP
- Main IPC: C23C16/00
- IPC: C23C16/00 ; H01L21/306 ; H05H1/46 ; C23F1/00 ; H01L21/3065 ; H01J37/32 ; H01F41/06

Abstract:
A surface wave plasma (SWP) source couples microwave (MW) energy into a processing chamber through, for example, a radial line slot antenna, to result in a low mean electron energy (Te). An ICP source, is provided between the SWP source and the substrate and is energized at a low power, less than 100 watts for 300 mm wafers, for example, at about 25 watts. The ICP source couples energy through a peripheral electric dipole coil to reduce capacitive coupling.
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