Invention Grant
- Patent Title: Geometry vectorization for mask process correction
-
Application No.: US15720182Application Date: 2017-09-29
-
Publication No.: US10386726B2Publication Date: 2019-08-20
- Inventor: Liang Cao , Wenchao Jiang , Guoxiang Ning , Jie Zhang
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Hoffman Warnick LLC
- Agent Anthony Canale
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G05B13/04

Abstract:
Various aspects include vectorization approaches for model-based mask proximity correction (MPC). In some cases, a computer-implemented method includes: assigning a set of vectors to geometry data describing at least one mask for forming an integrated circuit (IC); adjusting a statistical predictive model of the at least one mask based upon the set of vectors and the geometry data; predicting an adjustment to the at least one mask with the statistical predictive model; and adjusting instructions for forming the at least one mask in response to a predicted mask result of the statistical predictive model deviating from a target mask result for the at least one mask.
Public/Granted literature
- US20190101834A1 GEOMETRY VECTORIZATION FOR MASK PROCESS CORRECTION Public/Granted day:2019-04-04
Information query
IPC分类: