Invention Grant
- Patent Title: Measuring probe
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Application No.: US15440440Application Date: 2017-02-23
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Publication No.: US10393495B2Publication Date: 2019-08-27
- Inventor: Satoshi Koga , Akinori Saito , Hiroyuki Kanamori , Yutaka Kuriyama , Nobuhiro Ishikawa
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2016-036472 20160226
- Main IPC: G01B5/30
- IPC: G01B5/30 ; G01B7/00 ; G01B5/016 ; G01B7/012

Abstract:
A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.
Public/Granted literature
- US20170248400A1 MEASURING PROBE Public/Granted day:2017-08-31
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