Invention Grant
- Patent Title: Radiation detection device, radiation image acquiring system, radiation inspection system, and radiation detection method
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Application No.: US15407528Application Date: 2017-01-17
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Publication No.: US10393676B2Publication Date: 2019-08-27
- Inventor: Toshiyasu Suyama , Tadashi Maruno , Toshihide Sasaki , Junichi Sonoda , Shinji Takihi
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2008-288917 20081111
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01N23/046 ; G01N23/06 ; G01N23/083 ; G01N23/087 ; G01V5/00

Abstract:
A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.
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