- 专利标题: Analysis method for supporting classification
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申请号: US14912876申请日: 2014-08-05
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公开(公告)号: US10401275B2公开(公告)日: 2019-09-03
- 发明人: Barbara Kavsek , Peter Lederer , Peter Taal , Jan van den Boogaart
- 申请人: Siemens Healthcare Diagnostics Products GmbH
- 申请人地址: DE Marburg
- 专利权人: Siemens Healthcare Diagnostics Products GmbH
- 当前专利权人: Siemens Healthcare Diagnostics Products GmbH
- 当前专利权人地址: DE Marburg
- 代理机构: Dugan & Dugan, PC
- 优先权: DE102013216362 20130819
- 国际申请: PCT/EP2014/066786 WO 20140805
- 国际公布: WO2015/024770 WO 20150226
- 主分类号: G01N15/14
- IPC分类号: G01N15/14 ; G01N33/49 ; G01N21/49 ; G01N15/00 ; G01N15/10 ; G01N21/47
摘要:
The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Ys, Ei, Ii, σi for the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Ys, Ei, Ii, σi can be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values Pi of optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Ys.
公开/授权文献
- US20160202171A1 ANALYSIS METHOD FOR SUPPORTING CLASSIFICATION 公开/授权日:2016-07-14
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