Invention Grant
- Patent Title: Semiconductor devices with post-probe configurability
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Application No.: US16138003Application Date: 2018-09-21
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Publication No.: US10403585B2Publication Date: 2019-09-03
- Inventor: James E. Davis , Kevin G. Duesman , Jeffrey P. Wright , Warren L. Boyer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: H01L23/60
- IPC: H01L23/60 ; H01L23/538 ; H01L25/04 ; H01L23/00 ; G11C5/02 ; H01L25/065

Abstract:
A semiconductor device assembly includes a substrate and a die coupled to the substrate. The die includes a first contact pad electrically coupled to a first circuit on the die including at least one active circuit element, a second contact pad electrically coupled to a second circuit on the die including only passive circuit elements, and a plated pad electrically coupling at least a part of the first contact pad to at least a part of the second contact pad. The substrate includes a substrate contact electrically coupled to the plated pad on the die.
Public/Granted literature
- US20190148314A1 SEMICONDUCTOR DEVICES WITH POST-PROBE CONFIGURABILITY Public/Granted day:2019-05-16
Information query
IPC分类: