Invention Grant
- Patent Title: Measuring probe
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Application No.: US15440280Application Date: 2017-02-23
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Publication No.: US10415949B2Publication Date: 2019-09-17
- Inventor: Satoshi Koga , Akinori Saito , Hiroyuki Kanamori , Yutaka Kuriyama , Nobuhiro Ishikawa
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2016-036473 20160226
- Main IPC: G01B7/012
- IPC: G01B7/012 ; G01B7/00

Abstract:
A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
Public/Granted literature
- US20170248402A1 MEASURING PROBE Public/Granted day:2017-08-31
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