Invention Grant
- Patent Title: Substrate, method of sawing substrate, and semiconductor device
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Application No.: US15850336Application Date: 2017-12-21
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Publication No.: US10418335B2Publication Date: 2019-09-17
- Inventor: Yun-Rae Cho , Sundae Kim , Hyunggil Baek , Namgyu Baek , Seunghun Shin , Donghoon Won
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR
- Agency: Renaissance IP Law Group LLP
- Priority: KR10-2017-0030840 20170310
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L21/02 ; H01L21/78 ; H01L23/58

Abstract:
A method of dividing a substrate includes preparing a substrate including a crystalline semiconductor layer having a scribe lane region and device regions, a dielectric layer on the crystalline semiconductor layer, and a partition structure in physical contact with the dielectric layer and provided on the scribe lane region of the crystalline semiconductor layer, forming an amorphous region in the crystalline semiconductor layer, and performing a grinding process on the crystalline semiconductor layer after the forming of the amorphous region. The amorphous region is formed in the scribe lane region of the crystalline semiconductor layer.
Public/Granted literature
- US20180261555A1 SUBSTRATE, METHOD OF SAWING SUBSTRATE, AND SEMICONDUCTOR DEVICE Public/Granted day:2018-09-13
Information query
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