Invention Grant
- Patent Title: Display device and short circuit test method
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Application No.: US16002402Application Date: 2018-06-07
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Publication No.: US10444554B2Publication Date: 2019-10-15
- Inventor: Kyong-Tae Park
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR
- Agency: Innovation Counsel LLP
- Priority: KR10-2016-0033475 20160321
- Main IPC: G02F1/13
- IPC: G02F1/13 ; H01L21/66 ; G01R31/28 ; H01L27/12 ; H01L27/32 ; G09G3/00 ; G09G3/3233 ; H05B33/08 ; G01R31/44

Abstract:
A display device includes a substrate, one line on the substrate, the one line extending from a peripheral region through a display region, pixels on the display region, the pixels being connected to the one line, an outer line on the peripheral region, the outer line being connected to the one line during a short circuit test process that detects a position of a short circuit defect, an electrostatic protection resistor on the peripheral region, the electrostatic protection resistor being connected to the outer line, a pad on the peripheral region, the pad being connected to the outer line through the electrostatic protection resistor, a short circuit test signal being applied to the pad during the short circuit test process, and a bypass line connecting a node between the pad and the electrostatic protection resistor to the outer line.
Public/Granted literature
- US20180284498A1 DISPLAY DEVICE AND SHORT CIRCUIT TEST METHOD Public/Granted day:2018-10-04
Information query