Invention Grant
- Patent Title: Optimized scan interval
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Application No.: US15692407Application Date: 2017-08-31
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Publication No.: US10446197B2Publication Date: 2019-10-15
- Inventor: Kishore Kumar Muchherla , Ashutosh Malshe , Harish Singidi , Gianni Stephen Alsasua , Gary F. Besinga , Sampath Ratnam , Peter Sean Feeley
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/10 ; G11C8/10 ; G11C29/02

Abstract:
A variety of applications can include apparatus and/or methods of operating the apparatus that include a memory device having read levels that can be calibrated. A calibration controller implemented with the memory device can trigger a read level calibration based on inputs from one or more trackers monitoring parameters associated with the memory device and a determination of an occurrence of at least one event from a set of events related to the monitored parameters. The monitored parameters can include parameters related to a selected time interval and measurements of read, erase, or write operations of the memory device. Additional apparatus, systems, and methods are disclosed.
Public/Granted literature
- US20190066739A1 OPTIMIZED SCAN INTERVAL Public/Granted day:2019-02-28
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