Invention Grant
- Patent Title: VMIN retention detector apparatus and method
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Application No.: US16011356Application Date: 2018-06-18
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Publication No.: US10451675B2Publication Date: 2019-10-22
- Inventor: Vinayak Honkote , Sriram R. Vangal
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Green, Howard & Mughal LLP
- Main IPC: G01R31/3173
- IPC: G01R31/3173 ; G06F1/3206 ; G06F1/28 ; G06F1/30 ; G06F1/3296 ; G01R31/317 ; G06F1/26

Abstract:
Described is an apparatus which comprises: a state detector which is operable to detect logic states of zero and one in response to a clock edge; and an error detector coupled to the state detector, wherein the error detector is to detect an error in the detected logic states.
Public/Granted literature
- US20180299506A1 VMIN RETENTION DETECTOR APPARATUS AND METHOD Public/Granted day:2018-10-18
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