Invention Grant
- Patent Title: Latency measurement technology
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Application No.: US15856743Application Date: 2017-12-28
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Publication No.: US10459705B2Publication Date: 2019-10-29
- Inventor: Anton V. Gorshkov , Michael Berezalsky , Konstantin Levit-Guervich , Julia Fedorova , Noam Itzhaki , Arik Narkis , Sion Berkowits
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Jordan IP Law, LLC
- Main IPC: G06F8/41
- IPC: G06F8/41 ; G06F11/34

Abstract:
Systems, apparatuses and methods may provide for technology that receives compiled code and identifies a plurality of blocks in the compiled code. Instrumented code may be generated from the compiled code by modifying the blocks to include probes to measure latencies of the blocks during execution of the instrumented code on a graphics processing unit.
Public/Granted literature
- US20190042223A1 LATENCY MEASUREMENT TECHNOLOGY Public/Granted day:2019-02-07
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