- 专利标题: Concurrently evaluating assays with optical inhomogeneities
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申请号: US14113964申请日: 2012-04-23
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公开(公告)号: US10466163B2公开(公告)日: 2019-11-05
- 发明人: Toon Hendrik Evers , Derk Jan Wilfred Klunder , Jeroen Hans Nieuwenhuis , Joannes Baptist Adrianus Dionisius Van Zon
- 申请人: Toon Hendrik Evers , Derk Jan Wilfred Klunder , Jeroen Hans Nieuwenhuis , Joannes Baptist Adrianus Dionisius Van Zon
- 申请人地址: NL Eindhoven
- 专利权人: KONINKLIJKE PHILIPS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS N.V.
- 当前专利权人地址: NL Eindhoven
- 优先权: EP11164118 20110428
- 国际申请: PCT/IB2012/052028 WO 20120423
- 国际公布: WO2012/147021 WO 20121101
- 主分类号: G01N33/53
- IPC分类号: G01N33/53 ; G01N21/00 ; G01N21/552 ; G01N21/88 ; G01N21/94 ; G06T7/00 ; G01N33/52 ; G01N21/15
摘要:
During an assay, optical measurements are made at a sensing surface (112), and at least one “homogeneity-image” of the sensing surface (112) is generated. From this image, an “homogeneity-indicator” is determined for at least one region of interest, and the optical measurements are then evaluated in dependence on said indicator. The homogeneity-indicator may for example be a binary value which indicates if an inhomogeneity was detected or not. If an inhomogeneity was detected, all optical measurements may be rejected, only measurements for the involved region of interest may be rejected, or measurements for a selected sub-area of the involved region of interest (ROI) may be rejected.
公开/授权文献
- US20140051187A1 EVALUATING ASSAYS WHICH OPTICAL INHOMOGENEITIES 公开/授权日:2014-02-20
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