Systems and methods presented herein provide for computing read voltages for a storage device. In one embodiment, a controller is controller is operable to soft read data from a portion of the storage device, and to iteratively test the soft read data a predetermined number of times. For example, the controller may test the soft read data a number of times by applying a different probability weight to the soft read data each time the soft read data is tested. The controller may then decode the soft read data based on the probability weight, and determine an error metric of the decoded soft read data. Then, the controller determines a read voltage for the portion of the storage device based on the probability weight and the error metric.