Invention Grant
- Patent Title: On-die signal calibration
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Application No.: US15708121Application Date: 2017-09-18
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Publication No.: US10552169B2Publication Date: 2020-02-04
- Inventor: Ravindra Arjun Madpur , Amandeep Kaur
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Addison
- Agency: Vierra Magen Marcus LLP
- Priority: IN201721009431 20170317
- Main IPC: G06F9/4401
- IPC: G06F9/4401

Abstract:
Apparatuses, systems, methods, and computer program products are disclosed for on-die signal calibration. A calibration circuit on an integrated circuit device receives data from an active data path of the integrated circuit device and detects a variation in the received data from a calibration data pattern. An adjustment circuit on an integrated circuit device reduces a delay of an active data path of the integrated circuit device in response to detecting a first variation in received data. An adjustment circuit on an integrated circuit device increases a delay of an active data path of the integrated circuit device in response to detecting a second variation in received data.
Public/Granted literature
- US20180267810A1 ON-DIE SIGNAL CALIBRATION Public/Granted day:2018-09-20
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