Invention Grant
- Patent Title: Probe seat of vertical probe device
-
Application No.: US15363659Application Date: 2016-11-29
-
Publication No.: US10557866B2Publication Date: 2020-02-11
- Inventor: Tsung-Yi Chen , Shih-Shin Chen
- Applicant: MPI CORPORATION
- Applicant Address: TW Chu-Pei, Hsinchu Shien
- Assignee: MPI CORPORATION
- Current Assignee: MPI CORPORATION
- Current Assignee Address: TW Chu-Pei, Hsinchu Shien
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW104140230A 20151201
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R1/04

Abstract:
A probe seat of a vertical probe device includes a lower die, a middle die fixed on the lower die, at least one upper die fixed on the middle die, and at least one reinforcing die fixedly disposed in at least one through trough of the middle die. The lower die has lower probe holes located below the through trough, such that probes are be inserted through the lower probe holes respectively and inserted through the through trough. The at least one upper die has upper probe holes located above the through trough for the probes to be inserted therethrough. The at least one reinforcing die has middle probe holes for the probes to be inserted therethrough. As a result, the probe seat has improved rigidity to avoid bending.
Public/Granted literature
- US20170153271A1 PROBE SEAT OF VERTICAL PROBE DEVICE Public/Granted day:2017-06-01
Information query