公开(公告)号：US10281488B2

公开(公告)日：2019-05-07

申请号：US15488181

申请日：2017-04-14

Applicant: MPI CORPORATION

Inventor： Shih-Shin Chen ,  Cheng-En Wu ,  Chia-Hsiang Yu

IPC: G01R22/00 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  H01L21/00 ,  G01R1/00

Abstract: A probe card includes a substrate module having an installation hole and a first stair-shaped structure provided on two stairs thereof with a first connection surface and a first transmission surface having a first contact pad, a probe module having a probe and a second stair-shaped structure provided on two stairs thereof with a second connection surface and a second transmission surface having a second contact pad electrically connected with the probe, and a pressing member. The probe module is disposed in the installation hole so that the first and second connection surfaces are connected and the first and second transmission surfaces are opposite. The pressing member is detachably pressed on the probe module to press the second connection surface against the first connection surface and make the first and second contact pads electrically connected.

公开(公告)号：US10557866B2

公开(公告)日：2020-02-11

申请号：US15363659

申请日：2016-11-29

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Shih-Shin Chen

IPC: G01R1/073 ,  G01R1/04

Abstract: A probe seat of a vertical probe device includes a lower die, a middle die fixed on the lower die, at least one upper die fixed on the middle die, and at least one reinforcing die fixedly disposed in at least one through trough of the middle die. The lower die has lower probe holes located below the through trough, such that probes are be inserted through the lower probe holes respectively and inserted through the through trough. The at least one upper die has upper probe holes located above the through trough for the probes to be inserted therethrough. The at least one reinforcing die has middle probe holes for the probes to be inserted therethrough. As a result, the probe seat has improved rigidity to avoid bending.

公开(公告)号：US09435856B2

公开(公告)日：2016-09-06

申请号：US14253336

申请日：2014-04-15

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Chung-Tse Lee ,  Shih-Shin Chen

IPC: G01R31/01 ,  G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2889 ,  G01R1/07378

Abstract: A position adjustable probing device adapted for being mounted to a circuit board includes a frame, a probe head, a space transformer module and an elevation adjusting structure. The frame has a first surface, a second surface opposite to the first surface, and a first opening penetrating through the first and second surfaces. The probe head is coupled to the frame. The space transformer module is disposed in the first opening. The elevation adjusting structure is provided at the frame and has a plurality of spacers for adjusting a position of the frame relative to a reference surface in a vertical direction.

Abstract translation: 适于安装到电路板的位置可调探测装置包括框架，探针头，空间变换器模块和仰角调节结构。 框架具有第一表面，与第一表面相对的第二表面和穿过第一表面和第二表面的第一开口。 探头连接到框架。 空间变压器模块设置在第一开口中。 高度调节结构设置在框架处，并且具有多个间隔件，用于调节框架相对于参考表面在垂直方向上的位置。

公开(公告)号：US10393773B2

公开(公告)日：2019-08-27

申请号：US15274409

申请日：2016-09-23

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Ting-Hsin Kuo ,  Yi-Lung Lee ,  Shih-Shin Chen ,  Horng-Chuan Sun ,  Horng-Kuang Fan

IPC: G01R1/067 ,  G01R31/28 ,  H01R12/71 ,  H01R13/24 ,  H01R13/436 ,  G01R31/44

Abstract: A probe card includes a probe seat having upper and lower dies and a probe accommodating hole, a spring probe inserted through the probe accommodating hole and including a spring sleeve having upper and lower non-spring sections, and a circuit board disposed on the upper die and having a contact pad against which the spring probe is abutted. At least one of the upper and lower dies has a stopping surface partially facing the probe accommodating hole and an extended portion inserting hole in alignment with the probe accommodating hole. At least one of the upper and lower non-spring sections has a cylinder portion abutted on the stopping surface and an extended portion inserted through the extended portion inserting hole.

公开(公告)号：US09470750B2

公开(公告)日：2016-10-18

申请号：US14253675

申请日：2014-04-15

Applicant: MPI CORPORATION

Inventor： Tsung-Yi Chen ,  Chung-Tse Lee ,  Shih-Shin Chen

IPC: G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2889 ,  G01R1/07378

Abstract: An alignment adjusting mechanism for a probe card includes a frame, a substrate and positioning screws. The frame has an opening, an inner periphery wall surrounding around the opening, and an outer periphery wall corresponding to the inner periphery wall. The substrate is disposed in the opening and supported by a support flange extending from the inner periphery wall toward a center of the opening. The frame is provided with a plurality of positioning threaded holes each extending from the outer periphery wall to the inner periphery wall in communication with the opening. Each positioning screw is threaded into one of the positioning threaded holes and has an end stopped at a lateral side of the substrate. By turning the positioning screws, the planimetric position of the substrate on an imaginary plane is adjustable.

Abstract translation: 用于探针卡的对准调节机构包括框架，基板和定位螺钉。 框架具有开口，围绕开口的内周壁和与内周壁对应的外周壁。 基板设置在开口中并由从内周壁向开口中心延伸的支撑凸缘支撑。 框架设置有多个定位螺纹孔，每个定位螺纹孔从外周壁延伸到与开口连通的内周壁。 每个定位螺钉被拧入一个定位螺纹孔中，并且一端停在基片的侧面。 通过转动定位螺钉，基板在虚拟平面上的平面位置可调。