Invention Grant
- Patent Title: Accessing error statistics from DRAM memories having integrated error correction
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Application No.: US15961010Application Date: 2018-04-24
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Publication No.: US10572344B2Publication Date: 2020-02-25
- Inventor: Siva Srinivas Kothamasu
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Brian D. Graham; Charles A. Brill; Frank D. Cimino
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F13/16 ; G11C29/52 ; G11C29/04 ; G11C5/04
Abstract:
In described examples, a memory module includes a memory array with a primary access port coupled to the memory array. Error correction logic is coupled to the memory array. A statistics register is coupled to the error correction logic. A secondary access port is coupled to the statistics register to allow access to the statistics register by an external device without using the primary interface.
Public/Granted literature
- US20180314590A1 Accessing Error Statistics from Dram Memories Having Integrated Error Correction Public/Granted day:2018-11-01
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