发明授权
- 专利标题： Neural electrode for measuring neural signal and method for manufacturing the same
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申请号： US16116810申请日： 2018-08-29
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公开(公告)号： US10582865B2公开(公告)日： 2020-03-10
- 发明人: Yong Hee Kim , Sang Don Jung
- 申请人： ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 申请人地址： KR Daejeon
- 专利权人： ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 当前专利权人： ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 当前专利权人地址： KR Daejeon
- 优先权： KR10-2017-0118059 20170914
- 主分类号： A61B5/04
- IPC分类号： A61B5/04 ; C25D9/04 ; C25D5/34 ; C25D7/06 ; B82Y40/00 ; B82Y30/00
摘要：
Provided are a neural electrode for measuring a neural signal, and a method for manufacturing the same. The method for manufacturing the same includes forming an ITO electrode on a substrate, forming a passivation layer for exposing a portion of the ITO electrode, forming ITO nanowires on the ITO electrode, and forming a metal oxide on the ITO nanowires.
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