Invention Grant
- Patent Title: Transistor structure in low noise amplifier
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Application No.: US15893676Application Date: 2018-02-11
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Publication No.: US10600734B2Publication Date: 2020-03-24
- Inventor: Purakh Raj Verma , Chia-Huei Lin , Kuo-Yuh Yang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN201810035168 20180115
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L29/08 ; H01L29/78 ; H01L27/12 ; H01L29/423 ; H01L29/45 ; H01L21/768 ; H03F3/16 ; H01L21/321 ; H01L21/84

Abstract:
A semiconductor device on silicon-on-insulator (SOI) substrate includes: a first gate line and a second gate line extending along a first direction, a third gate extending along a second direction and between the first gate line and the second gate line, and a drain region adjacent to one side of the third gate line. Preferably, the third gate line includes a first protrusion overlapping the drain region.
Public/Granted literature
- US20190221517A1 SEMICONDUCTOR DEVICE Public/Granted day:2019-07-18
Information query
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