- 专利标题: Analog capacitor on submicron pitch metal level
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申请号: US16240194申请日: 2019-01-04
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公开(公告)号: US10608075B2公开(公告)日: 2020-03-31
- 发明人: Bhaskar Srinivasan , Guru Mathur , Stephen Arlon Meisner , Shih Chang Chang , Corinne Ann Gagnet
- 申请人: TEXAS INSTRUMENTS INCORPORATED
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 Andrew R. Ralston; Charles A. Brill; Frank D. Cimino
- 主分类号: H01L49/02
- IPC分类号: H01L49/02 ; H01L27/108 ; H01L29/66 ; H01L27/06 ; H01L29/16 ; H01L21/02 ; H01L21/768 ; H01L21/027 ; H01L21/3213 ; H01L23/532 ; H01L23/522 ; H01L29/94
摘要:
An integrated circuit includes a capacitor located over a semiconductor substrate. The capacitor includes a first conductive layer having a first lateral perimeter, and a second conductive layer having a second smaller lateral perimeter. A first dielectric layer is located between the second conductive layer and the first conductive layer. The first dielectric layer has a thinner portion having the first lateral perimeter and a thicker portion having the second lateral perimeter. An interconnect line is located over the substrate, and includes a third conductive layer that is about coplanar with and has about a same thickness as the first conductive layer. A second dielectric layer is located over the third conductive layer. The second dielectric layer is about coplanar with and has about a same thickness as the thinner portion of the first dielectric layer.
公开/授权文献
- US20190157379A1 ANALOG CAPACITOR ON SUBMICRON PITCH METAL LEVEL 公开/授权日:2019-05-23
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