- Patent Title: Measurement system and calibration method with wideband modulation
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Application No.: US16115158Application Date: 2018-08-28
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Publication No.: US10652051B2Publication Date: 2020-05-12
- Inventor: Gary R. Simpson , Sathya Padmanabhan , Steven M. Dudkiewicz , M. Tekamül Büber , Giampiero Esposito
- Applicant: Maury Microwave, Inc.
- Applicant Address: US CA Ontario
- Assignee: Maury Microwave, Inc.
- Current Assignee: Maury Microwave, Inc.
- Current Assignee Address: US CA Ontario
- Agent Larry K. Roberts
- Main IPC: H04L25/02
- IPC: H04L25/02 ; G01R31/319 ; G01R27/32 ; G01R31/28
Abstract:
A load pull system and method for calibrating the system and conducting measurements on a Device Under Test (DUT). The system includes at least one passive tuner; and a modulated signal connected to the DUT input. The passive tuner is calibrated at multiple frequencies within the modulation bandwidth of the modulated signal. The impedance and measured quantities such as power at the DUT reference plane are determined using tuner s-parameters at multiple frequencies within the modulation bandwidth.
Public/Granted literature
- US20190081822A1 MEASUREMENT SYSTEM AND CALIBRATION METHOD WITH WIDEBAND MODULATION Public/Granted day:2019-03-14
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