Invention Grant
- Patent Title: X-ray imaging system
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Application No.: US16402887Application Date: 2019-05-03
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Publication No.: US10653376B2Publication Date: 2020-05-19
- Inventor: Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz , Alan Francis Lyon
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Knobbe, Martens, Olson & Bear LLP
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03 ; H01J35/08 ; H01J35/12 ; G01N23/046 ; G01N23/041 ; A61B6/04

Abstract:
An x-ray imaging system includes an x-ray source, a beam-splitting grating having a plurality of structures arranged in a two-dimensional periodic array, a stage configured to hold an object to be imaged, and an x-ray detector having a two-dimensional array of x-ray detecting elements and positioned to detect x-rays diffracted by the beam-splitting grating and perturbed by the object to be imaged.
Public/Granted literature
- US20190254616A1 X-RAY INTERFEROMETRIC IMAGING SYSTEM Public/Granted day:2019-08-22
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