Invention Grant
- Patent Title: Analysis method and analyzer
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Application No.: US15608288Application Date: 2017-05-30
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Publication No.: US10672121B2Publication Date: 2020-06-02
- Inventor: Sayuri Tomoda , Nobuhiro Kitagawa , Jianyin Lu , Kosuke Jitsuhara
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe-Shi, Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-Shi, Hyogo
- Agency: Brinks Gilson & Lione
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6c3c60ab
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/00 ; G01N33/543 ; G01N35/00 ; G06T7/00 ; G01B11/24 ; G01N21/03 ; G01V8/10 ; H04N7/18 ; G01N21/76

Abstract:
Disclosed is an analysis method for detecting and analyzing light from a sample prepared so as to emit light in accordance with an amount of a test substance, the analysis method including taking an image of a storage member configured to store the sample therein; switching a state of a reflector to a state in which light from the sample is reflected toward a light detection unit and detecting light from the sample by the light detection unit; and outputting an analysis result of the sample on the basis of a light amount detected by the light detection unit.
Public/Granted literature
- US20170345148A1 ANALYSIS METHOD AND ANALYZER Public/Granted day:2017-11-30
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