- Patent Title: Extreme ultraviolet radiation source and cleaning method thereof
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Application No.: US16250026Application Date: 2019-01-17
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Publication No.: US10687410B2Publication Date: 2020-06-16
- Inventor: Chi Yang , Sheng-Ta Lin , Shang-Chieh Chien , Li-Jui Chen , Po-Chung Cheng
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H05G2/00
- IPC: H05G2/00 ; B08B5/02 ; B01D46/10 ; G03F7/20 ; H01L21/027

Abstract:
An extreme ultraviolet radiation source is provided, including a vessel, an optical collector, and a gas scrubber. The vessel has a gas inlet and a gas outlet. The optical collector is disposed within the vessel and configured to collect and reflect extreme ultraviolet light produced in the vessel. A cleaning gas is introduced into the vessel through the gas inlet to clean the surface of the optical collector. The gas scrubber is disposed within the vessel, arranged such that the cleaning gas leaves the vessel through the gas outlet after flowing through the gas scrubber. The gas scrubber has a number of gas passages to allow the cleaning gas to flow through, and the size of the gas passage close to the gas outlet is smaller than the size of the gas passage away from the gas outlet.
Public/Granted literature
- US20200037427A1 EXTREME ULTRAVIOLET RADIATION SOURCE AND CLEANING METHOD THEREOF Public/Granted day:2020-01-30
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