Invention Grant
- Patent Title: Automatic analyser and method
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Application No.: US15567758Application Date: 2016-04-07
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Publication No.: US10690690B2Publication Date: 2020-06-23
- Inventor: Akihiro Yasui , Saori Chida , Masaaki Hirano
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1d291625
- International Application: PCT/JP2016/061441 WO 20160407
- International Announcement: WO2016/170994 WO 20161027
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N21/31 ; G01N35/00

Abstract:
Provided is a specimen dispensing mechanism that includes a specimen nozzle dispensing a specimen to be analyzed in a specimen chamber to a reaction chamber by suctioning and ejecting the specimen, and the specimen dispensing mechanism is controlled so as to perform a specimen suctioning process of inserting the specimen nozzle into the specimen chamber and suctioning the specimen in the specimen chamber, a liquid suctioning process of suctioning a liquid by the specimen nozzle after the specimen suctioning process, and an ejection process of ejecting the liquid and a portion of the specimen to the empty reaction chamber from the specimen nozzle in this order. Thereby, it is possible to provide an automatic analyser and a method which are capable of dispensing a small amount of specimen with a high level of accuracy, without depending on the outer shape of a specimen nozzle or the viscosity of the specimen.
Public/Granted literature
- US20180120340A1 AUTOMATIC ANALYSER AND METHOD Public/Granted day:2018-05-03
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