Invention Grant
- Patent Title: Adjusting scan event thresholds to mitigate memory errors
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Application No.: US16138334Application Date: 2018-09-21
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Publication No.: US10691377B2Publication Date: 2020-06-23
- Inventor: Gianni Stephen Alsasua , Harish Reddy Singidi , Peter Sean Feeley , Ashutosh Malshe , Renato Padilla, Jr. , Kishore Kumar Muchherla , Sampath Ratnam
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/06 ; G11C16/34

Abstract:
Systems and methods are disclosed, comprising a memory device comprising multiple groups of memory cells, the groups comprising a first group of memory cells and a second group of memory cells configured to store information at a same bit capacity per memory cell, and a processing device operably coupled to the memory device, the processing device configured to adjust a scan event threshold for one of the first or second groups of memory cells to a threshold less than a target scan event threshold for the first and second groups of memory cells to distribute scan events in time on the memory device.
Public/Granted literature
- US20200097211A1 ADJUSTED SCAN EVENT THRESHOLDS Public/Granted day:2020-03-26
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